Fluorides for 2D Next-Generation Nanoelectronics

ERC (European Research Council)HORIZON-ERCID: 101055379
EC Contribution
€24,986
Consortium Size
1 orgs
Start Year
2022
Summary

The IRDS roadmap considers two-dimensional (2D) materials a promising option for scaling electronicdevices down to atomic dimensions. While there has been a lot of progress regarding 2D semiconductors,all electronic devices require suitable insulators as well. Although a major show-stopper, insulators havereceived far less attention and their is no clear roadmap as to which insulators can be used for ultimatelyscaled nanoelectronics.My group was recently first to demonstrate back-gated 2D FETs using ultrathin calcium fluoride (CaF2)as an insulator. Based on these promising results, I firmly believe that fluorides, which are ionic crystalswith often very wide bandgaps, can efficiently address the major challenges: (i) Although relativelyexotic materials, their growth is considerably better established than that of any 2D material. (ii) CaF2 canbe epitaxially grown layer-by-layer on silicon substrates and likely also on 2D semiconductors. As theirF-terminated inert surface supports van der Waals epitaxy of 2D materials, they could be the missing linkbetween 3D substrates and 2D semiconductors. (iii) The low-defectivity of the inert CaF2 surface willsignificantly improve device performance and stability. Thereby, fluorides will allow novel 2D devices tomake the leap from promising concepts to highly performant and stable real devices.F2GO will establish fluorides as a key enabler for 2D nanoelectronics by successfully demonstratingdevice architectures which were previously impossible to fabricate with sufficient performance due toinadequate insulators. I will do so by investigating selected fluoride-based devices for key technologies: (i)steep slope devices for CMOS logic (Cold Source FETs) at the ultimate scaling limit to allow sub-100 mVoperation and (ii) ultra-scaled non-volatile memory devices (Flash and TRAM). Thereby, F2GO will pavethe way for fluoride-based nanoelectronics at the ultimate scaling limit as required for the generations2030+.

Consortium (1)

Project Results (18)

Source: CORDIS, the EU research results database.

Publications (17)
All van der Waals Semiconducting PtSe<sub>2</sub> Field Effect Transistors with Low Contact Resistance Graphite Electrodes
Nano Letters· 2024DOI
M. Awais Aslam, Simon Leitner, Shubham Tyagi, Alexandros Provias, Vadym Tkachuk, Egon Pavlica, Martina Dienstleder, Daniel Knez, Kenji Watanabe, Takashi Taniguchi, Dayu Yan, Youguo Shi, Theresia Knobloch, Michael Waltl, Udo Schwingenschlögl, Tibor Grasser, Aleksandar Matković
Comprehensive study of SrF2 growth on highly oriented pyrolytic graphite (HOPG): Temperature-dependent van der Waals epitaxy
Applied Surface Science· 2024DOI
Mauro Borghi, Giulia Giovanelli, Monica Montecchi, Raffaella Capelli, Andrea Mescola, Guido Paolicelli, Sergio D’Addato, Tibor Grasser, Luca Pasquali
High-κ Wide-Gap Layered Dielectric for Two-Dimensional van der Waals Heterostructures
ACS Nano· 2024DOI
Aljoscha Söll, Edoardo Lopriore, Asmund Ottesen, Jan Luxa, Gabriele Pasquale, Jiri Sturala, František Hájek, Vítězslav Jarý, David Sedmidubský, Kseniia Mosina, Igor Sokolović, Saeed Rasouli, Tibor Grasser, Ulrike Diebold, Andras Kis, Zdeněk Sofer
Initial stages of growth and electronic properties of epitaxial SrF2 thin films on Ag(1 1 1)
Applied Surface Science· 2024DOI
Mauro Borghi, Andrea Mescola, Guido Paolicelli, Monica Montecchi, Sergio D'Addato, Simone Vacondio, Luca Bursi, Alice Ruini, Bryan P. Doyle, Tibor Grasser, Luca Pasquali
Machine learning force field for thermal oxidation of silicon
The Journal of Chemical Physics· 2024DOI
Lukas Cvitkovich, Franz Fehringer, Christoph Wilhelmer, Diego Milardovich, Dominic Waldhör, Tibor Grasser
Modeling the Impact of Interface and Border Traps on Hysteresis in Encapsulated Monolayer MoS<sub>2</sub> Based Double Gated FETs
2024 Austrochip Workshop on Microelectronics (Austrochip)· 2024DOI
Rittik Ghosh, Theresia Knobloch, Alexander Karl, Christoph Wilhelmer, Alexandros Provias, Dominic Waldhör, Tibor Grasser
Multi-Scale Modeling of Transistors Based on the 2D Semiconductor Bi<sub>2</sub>O<sub>2</sub>Se
2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)· 2024DOI
Mohammad Rasool Davoudi, Pedram Khakbaz, Theresia Knobloch, Dominic Waldhoer, Changze Liu, Aftab Nazir, Yichi Zhang, Hailin Peng, Tibor Grasser
Two-dimensional-materials-based transistors using hexagonal boron nitride dielectrics and metal gate electrodes with high cohesive energy
Nature Electronics· 2024DOI
Yaqing Shen, Kaichen Zhu, Yiping Xiao, Dominic Waldhr, Abdulrahman H. Basher, Theresia Knobloch, Sebastian Pazos, Xianhu Liang, Wenwen Zheng, Yue Yuan, Juan B. Roldan, Udo Schwingenschlgl, He Tian, Huaqiang Wu, Thomas F. Schranghamer, Nicholas Trainor, Joan M. Redwing, Saptarshi Das, Tibor Grasser, Mario Lanza
(Invited) Gate Stack Design for Field-Effect Transistors Based on Two-Dimensional Materials
ECS Meeting Abstracts· 2023DOI
Theresia Knobloch, Tibor Grasser
(Invited) High-Performance Field-Effect Transistors Based on Two-Dimensional Materials for VLSI Circuits
ECS Meeting Abstracts· 2023DOI
Theresia Knobloch, Siegfried Selberherr, Tibor Grasser
(Invited) High-Performance Field-Effect Transistors Based on Two-Dimensional Materials for VLSI Circuits
ECS Transactions· 2023DOI
Theresia Knobloch, Siegfried Selberherr, Tibor Grasser
Comphy v3.0—A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices
IOP Science· 2023DOI
Dominic Waldhoer; Christian Schleich; Jakob Michl; Alexander Grill; Dieter Claes; Alexander Karl; Theresia Knobloch; Gerhard Rzepa; Jacopo Franco; Ben Kaczer; Michael Waltl; Tibor Grasser
Defects in Strontium Titanate: A First Principles Study
2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)· 2023DOI
Mina Bahrami, Dominic Waldhoer, Pedram Khakbaz, Theresia Knobloch, Aftab Nazir, Changze Liu, Tibor Grasser
Modeling 2D Material-Based Nanoelectronic Devices in the Presence of Defects
IEEE Nanotechnology Magazine· 2023DOI
Theresia Knobloch, Dominic Waldhoer, Tibor Grasser
Modeling the Performance and Reliability of Two-Dimensional Semiconductor Transistors
2023 International Electron Devices Meeting (IEDM)· 2023DOI
T. Knobloch, D. Waldhoer, M. R. Davoudi, A. Karl, P. Khakbaz, M. Matzinger, Y. Zhang, K. K. H. Smithe, A. Nazir, C. Liu, Y. Y. Illarionov, E. Pop, H. Peng, B. Kaczer, T. Grasser
Observation of Rich Defect Dynamics in Monolayer MoS<sub>2</sub>
ACS Nano· 2023DOI
Harikrishnan Ravichandran, Theresia Knobloch, Andrew Pannone, Alexander Karl, Bernhard Stampfer, Dominic Waldhoer, Yikai Zheng, Najam U Sakib, Muhtasim Ul Karim Sadaf, Rahul Pendurthi, Riccardo Torsi, Joshua A. Robinson, Tibor Grasser, Saptarshi Das
Reliability Assessment of Double-Gated Wafer-Scale MoS<sub>2</sub> Field Effect Transistors through Hysteresis and Bias Temperature Instability Analyses
2023 International Electron Devices Meeting (IEDM)· 2023DOI
A. Provias, T. Knobloch, A. Kitamura, K. P. O’Brien, C. J. Dorow, D. Waldhoer, B. Stampfer, A. V. Penumatcha, S. Lee, R. Ramamurthy, S. Clendenning, M. Waltl, U. Avci, T. Grasser
Other Results (1)
Periodic Reporting for period 1 - F2GO (Fluorides for 2D Next-Generation Nanoelectronics)