All van der Waals Semiconducting PtSe<sub>2</sub> Field Effect Transistors with Low Contact Resistance Graphite Electrodes
M. Awais Aslam, Simon Leitner, Shubham Tyagi, Alexandros Provias, Vadym Tkachuk, Egon Pavlica, Martina Dienstleder, Daniel Knez, Kenji Watanabe, Takashi Taniguchi, Dayu Yan, Youguo Shi, Theresia Knobloch, Michael Waltl, Udo Schwingenschlögl, Tibor Grasser, Aleksandar Matković
Comprehensive study of SrF2 growth on highly oriented pyrolytic graphite (HOPG): Temperature-dependent van der Waals epitaxy
Applied Surface Science· 2024DOI Mauro Borghi, Giulia Giovanelli, Monica Montecchi, Raffaella Capelli, Andrea Mescola, Guido Paolicelli, Sergio D’Addato, Tibor Grasser, Luca Pasquali
High-κ Wide-Gap Layered Dielectric for Two-Dimensional van der Waals Heterostructures
Aljoscha Söll, Edoardo Lopriore, Asmund Ottesen, Jan Luxa, Gabriele Pasquale, Jiri Sturala, František Hájek, Vítězslav Jarý, David Sedmidubský, Kseniia Mosina, Igor Sokolović, Saeed Rasouli, Tibor Grasser, Ulrike Diebold, Andras Kis, Zdeněk Sofer
Initial stages of growth and electronic properties of epitaxial SrF2 thin films on Ag(1 1 1)
Applied Surface Science· 2024DOI Mauro Borghi, Andrea Mescola, Guido Paolicelli, Monica Montecchi, Sergio D'Addato, Simone Vacondio, Luca Bursi, Alice Ruini, Bryan P. Doyle, Tibor Grasser, Luca Pasquali
Machine learning force field for thermal oxidation of silicon
The Journal of Chemical Physics· 2024DOI Lukas Cvitkovich, Franz Fehringer, Christoph Wilhelmer, Diego Milardovich, Dominic Waldhör, Tibor Grasser
Modeling the Impact of Interface and Border Traps on Hysteresis in Encapsulated Monolayer MoS<sub>2</sub> Based Double Gated FETs
2024 Austrochip Workshop on Microelectronics (Austrochip)· 2024DOI Rittik Ghosh, Theresia Knobloch, Alexander Karl, Christoph Wilhelmer, Alexandros Provias, Dominic Waldhör, Tibor Grasser
Multi-Scale Modeling of Transistors Based on the 2D Semiconductor Bi<sub>2</sub>O<sub>2</sub>Se
2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)· 2024DOI Mohammad Rasool Davoudi, Pedram Khakbaz, Theresia Knobloch, Dominic Waldhoer, Changze Liu, Aftab Nazir, Yichi Zhang, Hailin Peng, Tibor Grasser
Two-dimensional-materials-based transistors using hexagonal boron nitride dielectrics and metal gate electrodes with high cohesive energy
Nature Electronics· 2024DOI Yaqing Shen, Kaichen Zhu, Yiping Xiao, Dominic Waldhr, Abdulrahman H. Basher, Theresia Knobloch, Sebastian Pazos, Xianhu Liang, Wenwen Zheng, Yue Yuan, Juan B. Roldan, Udo Schwingenschlgl, He Tian, Huaqiang Wu, Thomas F. Schranghamer, Nicholas Trainor, Joan M. Redwing, Saptarshi Das, Tibor Grasser, Mario Lanza
(Invited) Gate Stack Design for Field-Effect Transistors Based on Two-Dimensional Materials
ECS Meeting Abstracts· 2023DOI Theresia Knobloch, Tibor Grasser
(Invited) High-Performance Field-Effect Transistors Based on Two-Dimensional Materials for VLSI Circuits
ECS Meeting Abstracts· 2023DOI Theresia Knobloch, Siegfried Selberherr, Tibor Grasser
(Invited) High-Performance Field-Effect Transistors Based on Two-Dimensional Materials for VLSI Circuits
ECS Transactions· 2023DOI Theresia Knobloch, Siegfried Selberherr, Tibor Grasser
Comphy v3.0—A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices
Dominic Waldhoer; Christian Schleich; Jakob Michl; Alexander Grill; Dieter Claes; Alexander Karl; Theresia Knobloch; Gerhard Rzepa; Jacopo Franco; Ben Kaczer; Michael Waltl; Tibor Grasser
Defects in Strontium Titanate: A First Principles Study
2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)· 2023DOI Mina Bahrami, Dominic Waldhoer, Pedram Khakbaz, Theresia Knobloch, Aftab Nazir, Changze Liu, Tibor Grasser
Modeling 2D Material-Based Nanoelectronic Devices in the Presence of Defects
IEEE Nanotechnology Magazine· 2023DOI Theresia Knobloch, Dominic Waldhoer, Tibor Grasser
Modeling the Performance and Reliability of Two-Dimensional Semiconductor Transistors
2023 International Electron Devices Meeting (IEDM)· 2023DOI T. Knobloch, D. Waldhoer, M. R. Davoudi, A. Karl, P. Khakbaz, M. Matzinger, Y. Zhang, K. K. H. Smithe, A. Nazir, C. Liu, Y. Y. Illarionov, E. Pop, H. Peng, B. Kaczer, T. Grasser
Observation of Rich Defect Dynamics in Monolayer MoS<sub>2</sub>
Harikrishnan Ravichandran, Theresia Knobloch, Andrew Pannone, Alexander Karl, Bernhard Stampfer, Dominic Waldhoer, Yikai Zheng, Najam U Sakib, Muhtasim Ul Karim Sadaf, Rahul Pendurthi, Riccardo Torsi, Joshua A. Robinson, Tibor Grasser, Saptarshi Das
Reliability Assessment of Double-Gated Wafer-Scale MoS<sub>2</sub> Field Effect Transistors through Hysteresis and Bias Temperature Instability Analyses
2023 International Electron Devices Meeting (IEDM)· 2023DOI A. Provias, T. Knobloch, A. Kitamura, K. P. O’Brien, C. J. Dorow, D. Waldhoer, B. Stampfer, A. V. Penumatcha, S. Lee, R. Ramamurthy, S. Clendenning, M. Waltl, U. Avci, T. Grasser