Twinning for Excellence in Reliable Electronics

HORIZON.4.1HORIZON-CSAID: 101160314
EC Contribution
€11,980
Consortium Size
5 orgs
Summary

Reliable electronic systems are crucial in a wide range of applications, such as space missions, avionics, automotive, smart industry, medicine, banking, nuclear power plants, high energy physics research. With the introduction of advanced semiconductor technologies, the design of reliable electronic systems has become more challenging, requiring novel analysis and design methods and tools. The ultimate goal of TWIN-RELECT project is to boost the scientific and innovation capacity of UTH in the design of reliable electronic systems through strategic networking with three advanced partners: IHP - Institute for High Performance Microelectronics from Germany, National Center for Scientific Research (CNRS) from France, and University of Manchester from United Kingdom. The TWIN-RELECT collaboration will employ a set of actions grouped into five main components: (i) joint exploratory research aimed at the development of a novel tool for simulation of reliability effects and design of reliable integrated circuits, (ii) knowledge transfer through staff exchanges, joint training experiments, supervision of early stage researchers and organization of training schools, (iii) knowledge transfer in relation to research management and administration, (iv) enhancement of networking capacity through organization or workshops, business events, special sessions at conferences, webinars with related projects and international symposium, and (v) establishment of conditions for long term collaboration between UTH and advanced partners, as well as interested stakeholders.

Consortium (5)

Project Results (15)

Source: CORDIS, the EU research results database.

Publications (15)
Characterization of a Fault-Tolerant RISC-V SoC in an SRAM-Based FPGA under Proton Irradiation
IEEE Latin-American Test Symp. (LATS), 2026· 2026
Wesley Grignani, Douglas A. Santos, Carolina Imianosky, Douglas R. Melo, Frédéric Wrobel, and Luigi Dilillo
Design and Reliability Analysis of a Pipeline RISC-V Processor Core
IEEE Latin-American Test Symp. (LATS), 2026· 2026
Thiago H. Rausch, Wesley Grignani, Luigi Dilillo, and Douglas R. Melo
Efficient Reliability-Aware Hardware Trojan Design and Insertion for SET-Induced Soft Error Attacks
Electronics· 2026DOI
Alexandra Takou, Georgios-Ioannis Paliaroutis, Pelopidas Tsoumanis, Marko Andjelkovic, Fabian Vargas, Nestor Evmorfopoulos, George Stamoulis
UPSET: A Comprehensive Probabilistic Single Event Transient Analysis Flow for VLSI Circuits Using Static Timing Analysis
Electronics· 2026DOI
Christos Georgakidis, Dimitris Valiantzas, Nikolaos Chatzivangelis, Marko Andjelkovic, Christos Sotiriou, Milos Krstic
A Synthesis Toolflow for the Predictable Implementation of High-Performance Bundled-Data Asynchronous NoCs on FPGA
2025 29th IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC)· 2025DOI
Giuseppe Chessa; Elena Bellodi; Michele Favalli; Davide Zoni; Davide Bertozzi
Compact SER Models for Line-Source-Induced Charge Collection Using Model Order Reduction
2025 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)· 2025DOI
Pavlos Stoikos, Olympia Axelou, Pelopidas Tsoumanis, Georgios-Ioannis Paliaroutis, Luigi Dilillo, Anuj Pathania, George Floros
Compact SER Models via Model Order Reduction of Diffusion-Based Charge Collection
2025 21st International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD)· 2025DOI
Pavlos Stoikos, Olympia Axelou, Pelopidas Tsoumanis, Georgios-Ioannis Paliaroutis, George Floros
Efficient TinyML Inference on a Fault-Tolerant RISC-V SoC with Vector Extension
2025 10th International Workshop on Advances in Sensors and Interfaces (IWASI)· 2025DOI
Carolina Imianosky, Douglas A. Santos, Luigi Dilillo
Fault Injection Attacks Based on Layout-Driven SER Analysis
2025 21st International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD)· 2025DOI
Alexandra Takou, Pelopidas Tsoumanis, Georgios-Ioannis Paliaroutis, Nestor Evmorfopoulos, George Stamoulis
Multi-Partner Project: Twinning for Excellence in Reliable Electronics (TWIN-RELECT)
2025 Design, Automation & Test in Europe Conference (DATE)· 2025DOI
Andjelkovic, Marko; Vargas, Fabian; Krstic, Milos; Dilillo, Luigi; Michez, Alain; Wrobel, Frederic; Bertozzi, Davide; Luján, Mikel; Georgakidis, Christos; Chatzivangelis, Nikolaos; Tsilingiri, Katerina; Zazatis, Nikolaos Zazatis; Paliaroutis, Georgios Ioanis; Tsoumanis, Pelopidas; Sotiriou, Christos
Post-Placement Timing Optimisations on Asynchronous Designs
2025 29th IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC)· 2025DOI
Dimitrios Tsalapatas, Nikolaos Chatzivangelis, Christos P. Sotiriou, Nikolaos Sketopoulos
Prediction of Single Event Transient Propagation Using Machine Learning Models
2025 21st International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD)· 2025DOI
Marko Andjelkovic, Junchao Chen, Jelisaveta Aleksic, Vishnu Padmakumar, Milos Marjanovic, Nikolaos Zazatis, Trupti Ranjan Lenka, Danijel Dankovic, Christos Sotiriou, Fabian Vargas
Resilience Analysis of a Fault-Tolerant MPSoC Interconnection Architecture under SEU Fault Injection
IEEE Latin-American Test Symp. (LATS), 2025· 2025
Douglas A. Santos, Wesley Grignani, Carolina Imianosky, Douglas R. Melo, and Luigi Dilillo
Special Session Paper: Simulation Methodologies and Experiments for Reliability Analysis of Devices in Radiation Harsh Environments
2025 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)· 2025DOI
Nikoloas Chatzivangelis, Nikoloas Zazatis, Wesley Grignani, Georgios-Ioannis Paliaroutis, Douglas A. Santos, Carolina Imianosky, Maria Kastriotou, Carlo Cazzaniga, Frédéric Wrobel, Alessandro Veronesi, Christos Sotiriou, Marko Andjelkovic, Fabian L. Vargas, Davide Bertozzi, Luigi Dilillo
IEEE Journal on Emerging and Selected Topics in Circuits and Systems
IEEE Journal on Emerging and Selected Topics in Circuits and Systems· 2024DOI
Su, Zhe; Ramini, Simone; Coffen Marcolin, Demetra; Veronesi, Alessandro; Krstic, Milos; Indiveri, Giacomo; Bertozzi, Davide; Nowick, Steven M